Focal-plane array testing

Focal Plane Array testing is a specialized field of test engineering. Focal plane array (FPA) imaging devices are used in missile guidance sensors, infrared astronomy, manufacturing inspection, and thermal imaging. Focal plane array testing is the process of verifying and validating that these devices function correctly. Focal plane arrays are complex to develop, in some cases the fabrication process may have more than 150 steps,[1] testing of these devices must ensure that each step has the desired result.

A 2D nanowire array; light field in a nanolaser. Used to create a multi-color focal plane array.

The actual test methodology used for testing focal plane arrays differs depending on the type of device. However, the types of tests usually fall into one of the following categories: diagnostic, performance, statistical, system simulation, or end-to-end simulation.[2]

Government oversight of testing

The development and testing military technology such as FPAs is concentrated in the space and defense industries. As a result of this Congress, in 1983, established the Office of the Director of Operational Test and Evaluation (DOT&E) to coordinate, monitor, and evaluate operational testing of major weapon systems. A DOT&E report states this more directly: "The military services need confidence that their systems will not fail during mission execution..."[3]

As part of the Office of the Secretary of Defense, DOT&E is separate from acquisition (that also conducts developmental and operational testing) and therefore is in a position to provide the Secretary and Congress with an independent view. Congress created DOT&E in response to reports of conflicts of interest in the acquisition community's oversight of operational testing leading to inadequate testing of operational suitability and effectiveness and the fielding of new systems that performed poorly.

Notes
  1. Razeghi, Manijeh (2006). Fundamentals of Solid State Engineering. Birkhäuser. p. 807. ISBN 978-0-387-28152-0.
  2. Monroe Schlessinger, Irving J. Spiro (1995). Infrared Technology Fundamentals. CRC Press. p. 403. ISBN 978-0-8247-9259-6.CS1 maint: uses authors parameter (link)
  3. "Developing a Reliability Investment Model" (PDF). Retrieved 10 January 2009.

References
  • Hoke, Forney. Test and Evaluation of Infrared Detectors and Arrays. Society of Photo-optical Instrumentation Engineers. ISBN 978-0-8194-0144-1.
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