Franz Josef Giessibl

Franz Josef Gießibl (born 27 May 1962 in Amerang) is a German physicist and university professor at the University of Regensburg.

Life

Giessibl studied physics from 1982 to 1987 at the Technical University of Munich and at Eidgenössische Technischen Hochschule Zürich. He received a diploma in experimental physics in 1988 with Professor Gerhard Abstreiter and continued with a PhD in physics with Nobel Laureate Gerd Binnig at the IBM Physics Group Munich on atomic force microscopy. After submitting his PhD thesis in the end of 1991, he continued for 6 months as a Postdoctoral Fellow at the IBM Physics Group Munich and moved to Silicon Valley to join Park Scientific Instruments, Inc as a senior scientist and later director of vacuum products from mid 1992 until the end of 1994. He joined the Munich office of management consulting firm McKinsey & Company from 1995 to 1996 as a senior associate. During that time, he invented the qPlus sensor, a new probe for atomic force microscopy and continued experimental and theoretical work on the force microscope at the chair of Professor Jochen Mannhart at University of Augsburg where he received a habilitation in 2001.

In 2006, he joined the faculty at the Department of Physics at the University of Regensburg in Germany.[1] From about 2005, he collaborated with the scanning tunneling microscopy groups of IBM Almaden Research Center and IBM Zurich Research Laboratory and from about 2010 with National Institute of Standards and Technology to help to establish combined scanning tunneling microscopy and atomic force microscopy at ultralow temperatures. He was a visiting fellow at the center for nanoscience and technology (CNST) of the National Institute of Standards and Technology and a visiting professor at University of Maryland, College Park from fall 2015 to spring 2016.

Some of Giessibl's experimental and simulated images inspired the offset print editions Erster Blick (2000) [2] and Graphit (2004) by visual artist Gerhard Richter.[3]

Franz Giessibl is married and has two sons.

Scientific contributions

Giessibl spent most of his professional career improving atomic force microscopy,[4][5][6][7][8] and published papers on ground breaking experiments,[9][10] instrumentation[11] and theoretical foundations[12][13] of atomic force microscopy. Giessibl is the inventor of the qPlus sensor,[14][15] a sensor for Non-contact atomic force microscopy that relies on a quartz cantilever. His invention has enabled atomic force microscopy to obtain subatomic spatial resolution on individual atoms and submolecular resolution on organic molecules. Today, the qPlus sensor is used in many commercial and homebuilt atomic force microscopes.

Selected publications

Awards and honors

References

  1. "Lehrstuhl Prof. Dr. Franz J. Gießibl - Universität Regensburg". www.uni-regensburg.de.
  2. July 26, 2000 entry in https://www.gerhard-richter.com/en/chronology/
  3. Nielsen, K. H. (2008). "Nanotech, Blur and Tragedy in Recent Artworks by Gerhard Richter". Leonardo. 41 (5): 484–492. doi:10.1162/leon.2008.41.5.484. S2CID 57561154.
  4. "Nanophysik: Atome unterm Mikroskop". Spiegel Online. 27 July 2000.
  5. pop (23 January 2003). "Nanophysiker Franz Gießibl hantiert mit Apfelsinen". Die Welt via www.welt.de.
  6. Chang, Kenneth (22 February 2008). "Scientists Measure What It Takes to Push a Single Atom". The New York Times.
  7. "Scanning Probe Microscopy: From Sublime to Ubiquitous". Physical Review Letters. 2 May 2016.
  8. "Nature Nanotechnology's Anniversary issues of March and April 2016 mark the anniversary of a number of key discoveries in the history of nanotechnology" (PDF).
  9. Giessibl, F. J. (1995). "Atomic resolution of the Silicon (111)-(7x7) surface by atomic force microscopy" (PDF). Science. 267 (5194): 68–71. Bibcode:1995Sci...267...68G. doi:10.1126/science.267.5194.68. PMID 17840059. S2CID 20978364.
  10. Giessibl, F. J.; Hembacher, S.; Bielefeldt, H.; Mannhart, J. (2000). "Subatomic features on the Silicon (111)-(7x7) surface observed by atomic force microscopy" (PDF). Science. 289 (5478): 422–425. Bibcode:2000Sci...289..422G. doi:10.1126/science.289.5478.422. PMID 10903196.
  11. Giessibl, F. J.; Pielmeier, F.; Eguchi, T.; An, T.; Hasegawa, Y. (2011). "Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators.". Phys. Rev. B. 84 (12): 125409. arXiv:1104.2987. Bibcode:2011PhRvB..84l5409G. doi:10.1103/physrevb.84.125409. S2CID 22025299.
  12. Giessibl, F. J. (1997). "Forces and frequency shifts in atomic-resolution dynamic-force microscopy". Phys. Rev. B. 56 (24): 16010–16015. Bibcode:1997PhRvB..5616010G. doi:10.1103/physrevb.56.16010.
  13. Giessibl, F. J. (2003). "Advances in atomic force microscopy". Reviews of Modern Physics. 75 (3): 949–983. arXiv:cond-mat/0305119. Bibcode:2003RvMP...75..949G. doi:10.1103/revmodphys.75.949. S2CID 18924292.
  14. F. J. Giessibl: Device for noncontact intermittent contact scanning of a surface and a process therefore. US Patent 6240771
  15. F. J. Giessibl: Sensor for noncontact profiling of a surface. US Patent 8393009
  16. R&D 100 Award 1994 of R&D Magazine
  17. "nanoanalytik-hamburg.de". www.nanoanalytik-hamburg.de.
  18. "Augsburger Rasterkraftmikroskopie-Experte Gießibl erhält den Rudolf-Kaiser-Preis 2001". idw-online.de.
  19. "Die Stiftung - Karl Heinz Beckurts-Stiftung". www.beckurts-stiftung.de.
  20. "Colloquium Ehrenfestii in 2010". www.lorentz.leidenuniv.nl.
  21. "Zernike Colloquium Franz J. Giessibl (Atomic force microscopy using the qPlus sensor: resolving charge distributions within atoms, exchange interactions and atomic resolution in ambient conditions) - Loos Group - MCNPM - Zernike (ZIAM) - Research - University of Groningen". www.rug.nl. 2013-09-14.
  22. "2014 Keithley Award Recipient". www.aps.org.
  23. Kopnarski, Michael (2015). "Rudolf Jaeckel-Preis 2015 an Prof. Dr. Franz J. Gießibl". Vakuum in Forschung und Praxis. 27 (5): 38. doi:10.1002/vipr.201590050.
  24. Admin. "Foresight Prizes". Foresight Institute.
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